KARAKTERISASI DIFRAKSI SINAR X (XRD) FILM TIPIS BARIUM ZIRKONIUM TITANAT BaZr0,1Ti0,9O3 (BZT) DENGAN VARIASI SUHU ANNEALING

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dc.contributor.authorMelinda, Ria
dc.contributor.authorDewi, Rahmi
dc.date.accessioned2021-07-28T03:10:35Z
dc.date.available2021-07-28T03:10:35Z
dc.date.issued2020-08
dc.description.abstractThe thin film of Barium Zirconium Titanate (BZT) has been studied with composition of BaZr0,1Ti0,9O3 by using sol-gel method and annealed in temperature 600 ⁰C and 650 ⁰C in 1 hour. The thin film of BZT is characterized by using X-Ray Diffraction (XRD). The result samples in temperature 600⁰C dan 650⁰C to know crystal structure and size particle using Scherrer formula. The crystalize size of the sample is affected by the annealing. Moreover, the X-Ray Diffraction results show that the crystal structure of the sample is tetragonal, that has a lattice parameters of a = b = 4,03 Å c = 4,08 .en_US
dc.description.sponsorshipProgram S1 Fisika FMIPA-Universitas Riau Fakultas Matematika dan Ilmu Pengetahuan Alam, Universitas Riau, Pekanbaru, Riau, 28293, Indonesia.en_US
dc.identifier.otherwahyu sari yeni
dc.identifier.urihttps://repository.unri.ac.id/handle/123456789/10042
dc.language.isoenen_US
dc.subjectBaZr0en_US
dc.subject1Ti0,9O3en_US
dc.subjectSol-Gel Methoden_US
dc.subjectAnnealingen_US
dc.subjectCrystal Structureen_US
dc.titleKARAKTERISASI DIFRAKSI SINAR X (XRD) FILM TIPIS BARIUM ZIRKONIUM TITANAT BaZr0,1Ti0,9O3 (BZT) DENGAN VARIASI SUHU ANNEALINGen_US
dc.typeArticleen_US

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