KARAKTERISASI DIFRAKSI SINAR X (XRD) FILM TIPIS BARIUM ZIRKONIUM TITANAT BaZr0,1Ti0,9O3 (BZT) DENGAN VARIASI SUHU ANNEALING
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Date
2020-08
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Abstract
The thin film of Barium Zirconium Titanate (BZT) has been studied with
composition of BaZr0,1Ti0,9O3 by using sol-gel method and annealed in temperature
600 ⁰C and 650 ⁰C in 1 hour. The thin film of BZT is characterized by using X-Ray
Diffraction (XRD). The result samples in temperature 600⁰C dan 650⁰C to know
crystal structure and size particle using Scherrer formula. The crystalize size of the
sample is affected by the annealing. Moreover, the X-Ray Diffraction results show
that the crystal structure of the sample is tetragonal, that has a lattice parameters of a
= b = 4,03 Å c = 4,08 .
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Keywords
BaZr0, 1Ti0,9O3, Sol-Gel Method, Annealing, Crystal Structure