DETEKSI BENIH PADI MENGGUNAKAN METODE YOU ONLY LOOK ONCE (STUDI KASUS: UPT PSBTPH PROVINSI RIAU)
| dc.contributor.author | Mujahidah, Aliya Izzati | |
| dc.contributor.supervisor | Id, Ibnu Daqiqil | |
| dc.date.accessioned | 2024-02-23T07:48:18Z | |
| dc.date.available | 2024-02-23T07:48:18Z | |
| dc.date.issued | 2023-11 | |
| dc.description.abstract | Seeds circulating in Indonesia are required to have seed eligibility certificates regulated by PERMENTAN No. 12 of 2018. One of the processes to obtain seed feasibility certification is the purity analysis laboratory test. In this process, the seed analyst sorts working samples of seeds that contain several components, including pure seeds and non-pure seeds. The sorting is done manually by identifying the seeds in the working samples based on their morphological appearance. In this study, object detection of rice seeds was conducted using the "You Only Look Once (YOLO)" algorithm. YOLO is a real-time object detection algorithm. The method used is transfer learning with the pre-trained YOLOv5s model, which is one of the models from YOLO version 5. The dataset consists of 235 photos of working examples of rice seeds, with two classes labeled as rice and non-rice. The evaluation results of the overall model performance are as follows: precision of 0.908, recall of 0.808, mAP@0.5 of 0.859, and F1_Score of 0.85. | en_US |
| dc.description.sponsorship | Fakultas Matematika dan Ilmu Pengetahuan Alam | en_US |
| dc.identifier.citation | Perpustakaan | en_US |
| dc.identifier.other | Elfitra | |
| dc.identifier.uri | https://repository.unri.ac.id/handle/123456789/11316 | |
| dc.language.iso | en | en_US |
| dc.publisher | Elfitra | en_US |
| dc.subject | Rice Seed | en_US |
| dc.subject | Object Detection | en_US |
| dc.subject | You Only Look Once | en_US |
| dc.subject | YOLOv5 | en_US |
| dc.title | DETEKSI BENIH PADI MENGGUNAKAN METODE YOU ONLY LOOK ONCE (STUDI KASUS: UPT PSBTPH PROVINSI RIAU) | en_US |
| dc.title.alternative | Elfitra | en_US |
| dc.type | Article | en_US |