Abstract:
Thin layer of barium zirconium titanate (BaZr0,3Ti0,7O3) was grown on a glass substrate using
sol-gel method with variations in annealing temperature assisted by a spin coating process at a
speed of 3000 rpm. The BaZr0,3Ti0,7O3 thin layer was annealed for 1 hour at a temperature of
600oC and 650oC. Characterization was carried out using X-Ray Diffractometer (XRD) to
determine the crystal structure, lattice parameters, and type of structure. The crystal structure
shows that the lattice parameters are a = b ≠ c, it can be concluded that the crystal structure is
tetragonal. The particle size was obtained using Scherer formula. The two annealing
temperatures produced in XRD characterization produced the same 2θ angles, namely 22.29o,
31.61o, 38.31o and 47.54o. The increase in annealing temperature does not affect the
diffraction angle but rather affects the intensity.
