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KARAKTERISASI FILM TIPIS BaZr0,35Ti0,65O3 DENGAN SUHU ANNEALING 600 DAN 650 MENGGUNAKAN X-RAY DIFFRACTION

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dc.contributor.author Dewi, Rahmi
dc.date.accessioned 2021-12-27T04:22:49Z
dc.date.available 2021-12-27T04:22:49Z
dc.date.issued 2021-06
dc.identifier.other wahyu sari yeni
dc.identifier.uri https://repository.unri.ac.id/handle/123456789/10347
dc.description.abstract Barium titanate (BaTiO3) is a basic ferroelectric component material which made in the form of a thin film. Barium Titanate is doped with Zr and made a thin film (BaZr0.35Ti0.65O3). BZT is the main material that is most interesting to be studied because it has a high dielectric constant. This thin film was deposited onto glass substrate that assisted by spin coating with speed of 3000 rpm for 30 seconds. The growth of this thin film was made by variying annealing temperature of 600 and 650 for 1 hour. The BaZr0,35Ti0,65O3 was anlyzed using X-Ray Diffraction (XRD) method and the crystallite size of the sample was determined using Scherrer formula. The crystallite size of the sample is affected by the annealing temperature. Moreover, the X-Ray Diffraction results show that the crystal structure of the sample is tetragonal, that has a lattice parameters of a = b = 4.00 and c = 4.02 angstroms. en_US
dc.description.provenance Submitted by wahyu sari yeni (ayoe32@ymail.com) on 2021-12-27T04:22:49Z No. of bitstreams: 1 Fina Sela_compressed.pdf: 193482 bytes, checksum: 863d569750408a008dbb2e0644a91732 (MD5) en
dc.description.provenance Made available in DSpace on 2021-12-27T04:22:49Z (GMT). No. of bitstreams: 1 Fina Sela_compressed.pdf: 193482 bytes, checksum: 863d569750408a008dbb2e0644a91732 (MD5) Previous issue date: 2021-06 en
dc.description.sponsorship Fisika, Fakultas Matematika dan Ilmu Pengetahuan Alam, Universitas Riau (UNRI) Jl. Prof. Muchtar Luthfi Pekanbaru, 28293, Indonesia en_US
dc.language.iso en en_US
dc.publisher perpustakaan UR en_US
dc.subject Barium Zirconium Titanate en_US
dc.subject Sol-gel Method en_US
dc.subject Annealing en_US
dc.title KARAKTERISASI FILM TIPIS BaZr0,35Ti0,65O3 DENGAN SUHU ANNEALING 600 DAN 650 MENGGUNAKAN X-RAY DIFFRACTION en_US
dc.type Article en_US
dc.contributor.supervisor Sela, Fina


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